, SOC test design and its optimization is the topic of Introduction to Advanced System-on-Chip Test Design and Optimization. It gives an introduction to testing, describes the problems related to SOC testing, discusses the modeling granularity and the implementation into EDA (electronic design automation) tools. The book is divided into three sections: i) test concepts, ii) SOC design for test, and iii) SOC test applications. The first part covers an introduction into test problems including faults, fault types, design-flow, design-for-test techniques such as scan-testing and Boundary Scan. The second part of the book discusses SOC related problems such as system modeling, test conflicts, power consumption, test access mechanism design, test scheduling and defect-oriented scheduling. Finally, the third part focuses on SOC applications, such as integrated test scheduling and TAM design, defect-oriented scheduling, and integrating test design with the core selection process.
, <p>Space-time coding is a technique that promises greatly improved performance in wireless networks by using multiple antennas at the transmitter and receiver. Space-Time Block Coding for Wireless Communications is an introduction to the theory of this technology. The authors develop the topic using a unified framework and cover a variety of topics ranging from information theory to performance analysis and state-of-the-art space-time coding methods for both flat and frequency-selective fading multiple-antenna channels. The authors concentrate on key principles rather than specific practical applications, and present the material in a concise and accessible manner. Their treatment reviews the fundamental aspects of multiple-input, multiple output communication theory, and guides the reader through a number of topics at the forefront of current research and development. The book includes homework exercises and is aimed at graduate students and researchers working on wireless communicati